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Built-in self-test
Results: 23

#	Item
11	Project result CT302 I Towards one European test solution [TOETS] A testing dilemma As semiconductor chip Add to Reading List Source URL: www.aeneas-office.eu Language: English - Date: 2014-07-21 10:33:01 Integrated circuits Design for X Semiconductor device fabrication Packaging Reliability engineering Survival analysis Built-in self-test Application-specific integrated circuit NXP Semiconductors Technology Electronic engineering Design
12	Reliability Digest, FebruaryMessage from the Editor Commercial electronic components are increasingly being used in safety critical high reliability applications with significantly longer life time than Add to Reading List Source URL: rs.ieee.org Language: English - Date: 2015-03-26 07:50:28 Engineering Survival analysis Failure Materials science Reliability engineering Automotive electronics Built-in self-test Life-critical system Reliability Software quality Systems engineering Technology
13	teasers-valorisation_v2 (2).pdf Add to Reading List Source URL: www.tudelft.nl Language: English - Date: 2011-11-23 05:53:56 Cross-platform software Software engineering Built-in self-test Algorithm Electronics Integrated circuits Computing C
14	BIST Hardware Synthesis for RTL Data Paths Based on Test Compatibility Classes Nicola Nicolici, Bashir M. Al-Hashimi, Andrew D. Brown, and Alan C. Williams Nicola Nicolici Bashir M. Al-Hashimi Andrew D. Brown Add to Reading List Source URL: eprints.soton.ac.uk Language: English - Date: 2009-12-08 11:04:34 Design for testing Built-in self-test Automatic test pattern generation High-level synthesis Digital electronics Electronic engineering Electronic design automation Design
15	Reference Page TECHNICAL BRIEF missim Technical Brief Add to Reading List Source URL: www.ruag.com Language: English - Date: 2014-09-02 10:01:08 RUAG Built-in self-test
16	Ridgetop Group, Inc[removed]North Oracle Road Tucson, AZ[removed]Phone: [removed]Fax: [removed]www.RidgetopGroup.com Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2010-06-14 19:18:04 Built-in self-test Ball grid array Prognostics Dryden Flight Research Center Printed circuit board Technology Electromagnetism Electronics Electronics manufacturing
17	FOR IMMEDIATE RELEASE Ridgetop Group, Inc[removed]North Oracle Road Tucson, AZ[removed]Phone: [removed] Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2011-02-11 12:03:40 Fabless semiconductor companies Electronics manufacturing Field-programmable gate array Prognostics Altera Built-in self-test Ball grid array Semiconductor intellectual property core Solder Electronic engineering Electronics Electromagnetism
18	Ridgetop Group, Inc[removed]North Oracle Road, Suite 153 Tucson, AZ[removed]Phone: ([removed]Fax: ([removed]www.Ridgetop-Group.com Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2010-06-14 19:17:34 Built-in self-test Technology Field-programmable gate array Raytheon Electronic engineering Electronics
19	Ridgetop Group, Inc[removed]North Oracle Road Tucson, AZ[removed]Phone: [removed]Fax: [removed]www.RidgetopGroup.com Add to Reading List Source URL: www.ridgetopgroup.com Language: English - Date: 2011-02-16 11:19:07 Fabless semiconductor companies Field-programmable gate array Electronics manufacturing Ball grid array Altera Semiconductor intellectual property core Prognostics Built-in self-test Solder Electronic engineering Electronics Electromagnetism
20	Project result CT302 I Towards one European test solution [TOETS] A testing dilemma As semiconductor chip Add to Reading List Source URL: www.catrene.org Language: English - Date: 2014-07-07 11:34:38 Integrated circuits Design for X Semiconductor device fabrication Packaging Reliability engineering Survival analysis Built-in self-test Application-specific integrated circuit NXP Semiconductors Technology Electronic engineering Design

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